Effect of substrate hot-carrier injection on quasibreakdown of ultrathin gate oxide
Journal of Applied Physics
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Main Authors: | Cho, B.J., Xu, Z., Guan, H., Li, M.F. |
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Other Authors: | ELECTRICAL ENGINEERING |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/62095 |
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Institution: | National University of Singapore |
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