Effect of substrate hot-carrier injection on quasibreakdown of ultrathin gate oxide

Journal of Applied Physics

Saved in:
Bibliographic Details
Main Authors: Cho, B.J., Xu, Z., Guan, H., Li, M.F.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/62095
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore
Be the first to leave a comment!
You must be logged in first