Study of acid diffusion in a positive tone chemically amplified resist using an on-wafer imaging technique

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

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Bibliographic Details
Main Authors: Lu, B., Taylor, J.W., Cerrina, F., Soo, C.P., Bourdillon, A.J.
Other Authors: MATERIALS SCIENCE
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/107215
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Institution: National University of Singapore