Atomic force microscopy investigation of the O2 +-induced surface topography of InP

Surface and Interface Analysis

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Bibliographic Details
Main Authors:	Pan, J.S., Tay, S.T., Huan, C.H.A., Wee, A.T.S.
Other Authors:	INST OF MATERIALS RESEARCH & ENGINEERING
Format:	Article
Published:	2014
Subjects:	AFM InP Ion bombardment Surface topography X-ray photoelectron spectroscopy XPS
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/113228
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-113228
record_format	dspace
spelling	sg-nus-scholar.10635-1132282015-02-05T10:39:15Z Atomic force microscopy investigation of the O2 +-induced surface topography of InP Pan, J.S. Tay, S.T. Huan, C.H.A. Wee, A.T.S. INST OF MATERIALS RESEARCH & ENGINEERING PHYSICS AFM InP Ion bombardment Surface topography X-ray photoelectron spectroscopy XPS Surface and Interface Analysis 26 12 930-938 SIAND 2014-11-30T06:41:11Z 2014-11-30T06:41:11Z 1998-11 Article Pan, J.S.,Tay, S.T.,Huan, C.H.A.,Wee, A.T.S. (1998-11). Atomic force microscopy investigation of the O2 +-induced surface topography of InP. Surface and Interface Analysis 26 (12) : 930-938. ScholarBank@NUS Repository. 01422421 http://scholarbank.nus.edu.sg/handle/10635/113228 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
topic	AFM InP Ion bombardment Surface topography X-ray photoelectron spectroscopy XPS
spellingShingle	AFM InP Ion bombardment Surface topography X-ray photoelectron spectroscopy XPS Pan, J.S. Tay, S.T. Huan, C.H.A. Wee, A.T.S. Atomic force microscopy investigation of the O2 +-induced surface topography of InP
description	Surface and Interface Analysis
author2	INST OF MATERIALS RESEARCH & ENGINEERING
author_facet	INST OF MATERIALS RESEARCH & ENGINEERING Pan, J.S. Tay, S.T. Huan, C.H.A. Wee, A.T.S.
format	Article
author	Pan, J.S. Tay, S.T. Huan, C.H.A. Wee, A.T.S.
author_sort	Pan, J.S.
title	Atomic force microscopy investigation of the O2 +-induced surface topography of InP
title_short	Atomic force microscopy investigation of the O2 +-induced surface topography of InP
title_full	Atomic force microscopy investigation of the O2 +-induced surface topography of InP
title_fullStr	Atomic force microscopy investigation of the O2 +-induced surface topography of InP
title_full_unstemmed	Atomic force microscopy investigation of the O2 +-induced surface topography of InP
title_sort	atomic force microscopy investigation of the o2 +-induced surface topography of inp
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/113228
_version_	1681094619665793024

Atomic force microscopy investigation of the O2 +-induced surface topography of InP

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