Auger electron spectroscopy and x-ray photoelectron spectroscopy analysis of angle of incidence effects of ion beam nitridation of GaAs

Journal of Materials Research

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Main Authors:	Pan, J.S., Huan, C.H.A., Wee, A.T.S., Tan, H.S., Tan, K.L.
Other Authors:	PHYSICS
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/113229
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Institution:	National University of Singapore

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spelling	sg-nus-scholar.10635-1132292024-11-12T21:16:30Z Auger electron spectroscopy and x-ray photoelectron spectroscopy analysis of angle of incidence effects of ion beam nitridation of GaAs Pan, J.S. Huan, C.H.A. Wee, A.T.S. Tan, H.S. Tan, K.L. PHYSICS INST OF MATERIALS RESEARCH & ENGINEERING Journal of Materials Research 13 7 1799-1807 JMREE 2014-11-30T06:41:11Z 2014-11-30T06:41:11Z 1998-07 Article Pan, J.S.,Huan, C.H.A.,Wee, A.T.S.,Tan, H.S.,Tan, K.L. (1998-07). Auger electron spectroscopy and x-ray photoelectron spectroscopy analysis of angle of incidence effects of ion beam nitridation of GaAs. Journal of Materials Research 13 (7) : 1799-1807. ScholarBank@NUS Repository. 08842914 http://scholarbank.nus.edu.sg/handle/10635/113229 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	Journal of Materials Research
author2	PHYSICS
author_facet	PHYSICS Pan, J.S. Huan, C.H.A. Wee, A.T.S. Tan, H.S. Tan, K.L.
format	Article
author	Pan, J.S. Huan, C.H.A. Wee, A.T.S. Tan, H.S. Tan, K.L.
spellingShingle	Pan, J.S. Huan, C.H.A. Wee, A.T.S. Tan, H.S. Tan, K.L. Auger electron spectroscopy and x-ray photoelectron spectroscopy analysis of angle of incidence effects of ion beam nitridation of GaAs
author_sort	Pan, J.S.
title	Auger electron spectroscopy and x-ray photoelectron spectroscopy analysis of angle of incidence effects of ion beam nitridation of GaAs
title_short	Auger electron spectroscopy and x-ray photoelectron spectroscopy analysis of angle of incidence effects of ion beam nitridation of GaAs
title_full	Auger electron spectroscopy and x-ray photoelectron spectroscopy analysis of angle of incidence effects of ion beam nitridation of GaAs
title_fullStr	Auger electron spectroscopy and x-ray photoelectron spectroscopy analysis of angle of incidence effects of ion beam nitridation of GaAs
title_full_unstemmed	Auger electron spectroscopy and x-ray photoelectron spectroscopy analysis of angle of incidence effects of ion beam nitridation of GaAs
title_sort	auger electron spectroscopy and x-ray photoelectron spectroscopy analysis of angle of incidence effects of ion beam nitridation of gaas
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/113229
_version_	1821203647432753152

Auger electron spectroscopy and x-ray photoelectron spectroscopy analysis of angle of incidence effects of ion beam nitridation of GaAs

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