High frequency dielectric properties distribution of BiFeO3 thin film using near-field microwave microscopy
10.1063/1.3258201
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sg-nus-scholar.10635-1151312023-11-01T07:09:14Z High frequency dielectric properties distribution of BiFeO3 thin film using near-field microwave microscopy Zhang, X.-Y. Wang, X.-C. Xu, F. Ma, Y.-G. Ong, C.K. TEMASEK LABORATORIES PHYSICS 10.1063/1.3258201 Review of Scientific Instruments 80 11 - RSINA 2014-12-12T07:11:28Z 2014-12-12T07:11:28Z 2009 Article Zhang, X.-Y., Wang, X.-C., Xu, F., Ma, Y.-G., Ong, C.K. (2009). High frequency dielectric properties distribution of BiFeO3 thin film using near-field microwave microscopy. Review of Scientific Instruments 80 (11) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.3258201 00346748 http://scholarbank.nus.edu.sg/handle/10635/115131 000273061100036 Scopus |
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TEMASEK LABORATORIES |
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TEMASEK LABORATORIES Zhang, X.-Y. Wang, X.-C. Xu, F. Ma, Y.-G. Ong, C.K. |
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Zhang, X.-Y. Wang, X.-C. Xu, F. Ma, Y.-G. Ong, C.K. |
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Zhang, X.-Y. Wang, X.-C. Xu, F. Ma, Y.-G. Ong, C.K. High frequency dielectric properties distribution of BiFeO3 thin film using near-field microwave microscopy |
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Zhang, X.-Y. |
title |
High frequency dielectric properties distribution of BiFeO3 thin film using near-field microwave microscopy |
title_short |
High frequency dielectric properties distribution of BiFeO3 thin film using near-field microwave microscopy |
title_full |
High frequency dielectric properties distribution of BiFeO3 thin film using near-field microwave microscopy |
title_fullStr |
High frequency dielectric properties distribution of BiFeO3 thin film using near-field microwave microscopy |
title_full_unstemmed |
High frequency dielectric properties distribution of BiFeO3 thin film using near-field microwave microscopy |
title_sort |
high frequency dielectric properties distribution of bifeo3 thin film using near-field microwave microscopy |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/115131 |
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