High frequency dielectric properties distribution of BiFeO3 thin film using near-field microwave microscopy
10.1063/1.3258201
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Main Authors: | Zhang, X.-Y., Wang, X.-C., Xu, F., Ma, Y.-G., Ong, C.K. |
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Other Authors: | TEMASEK LABORATORIES |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/115131 |
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Institution: | National University of Singapore |
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