Negative capacitance induced by redistribution of oxygen vacancies in the fatigued BiFeO 3-based thin film

Negative capacitance induced by redistribution of oxygen vacancies in the fatigued BiFeO 3-based thin film

10.1063/1.4733982

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Bibliographic Details
Main Authors: Ke, Q., Lou, X., Yang, H., Kumar, A., Zeng, K., Wang, J.
Other Authors: MECHANICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/85478
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Institution: National University of Singapore

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http://scholarbank.nus.edu.sg/handle/10635/85478

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