Microstructural evolution of charged defects in the fatigue process of polycrystalline BiFeO3 thin films

Microstructural evolution of charged defects in the fatigue process of polycrystalline BiFeO3 thin films

Acta Materialia

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Bibliographic Details
Main Authors: Ke, Qingqing, Kumar, Amit, Lou, Xiaojie, Feng, Yuan Ping, Zeng, Kaiyang, Cai, Yongqing, Wang, John
Other Authors: MATERIALS SCIENCE AND ENGINEERING
Format: Article
Published: Elsevier 2016
Online Access:http://scholarbank.nus.edu.sg/handle/10635/123201
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Institution: National University of Singapore

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http://scholarbank.nus.edu.sg/handle/10635/123201

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