Microstructural evolution of charged defects in the fatigue process of polycrystalline BiFeO3 thin films

Microstructural evolution of charged defects in the fatigue process of polycrystalline BiFeO3 thin films

Acta Materialia

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Bibliographic Details
Main Authors: Ke, Qingqing, Kumar, Amit, Lou, Xiaojie, Feng, Yuan Ping, Zeng, Kaiyang, Cai, Yongqing, Wang, John
Other Authors: MATERIALS SCIENCE AND ENGINEERING
Format: Article
Published: Elsevier 2016
Online Access:http://scholarbank.nus.edu.sg/handle/10635/123201
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-1232012016-04-29T22:03:34Z Microstructural evolution of charged defects in the fatigue process of polycrystalline BiFeO3 thin films Ke, Qingqing Kumar, Amit Lou, Xiaojie Feng, Yuan Ping Zeng, Kaiyang Cai, Yongqing Wang, John MATERIALS SCIENCE AND ENGINEERING Acta Materialia 82 190-197 2016-04-29T06:03:19Z 2016-04-29T06:03:19Z 2014 Article Ke, Qingqing,Kumar, Amit,Lou, Xiaojie,Feng, Yuan Ping,Zeng, Kaiyang,Cai, Yongqing,Wang, John (2014). Microstructural evolution of charged defects in the fatigue process of polycrystalline BiFeO3 thin films. Acta Materialia 82 : 190-197. ScholarBank@NUS Repository. 13596454 http://scholarbank.nus.edu.sg/handle/10635/123201 NOT_IN_WOS Elsevier
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
description Acta Materialia
author2 MATERIALS SCIENCE AND ENGINEERING
author_facet MATERIALS SCIENCE AND ENGINEERING
Ke, Qingqing
Kumar, Amit
Lou, Xiaojie
Feng, Yuan Ping
Zeng, Kaiyang
Cai, Yongqing
Wang, John
format Article
author Ke, Qingqing
Kumar, Amit
Lou, Xiaojie
Feng, Yuan Ping
Zeng, Kaiyang
Cai, Yongqing
Wang, John
spellingShingle Ke, Qingqing
Kumar, Amit
Lou, Xiaojie
Feng, Yuan Ping
Zeng, Kaiyang
Cai, Yongqing
Wang, John
Microstructural evolution of charged defects in the fatigue process of polycrystalline BiFeO3 thin films
author_sort Ke, Qingqing
title Microstructural evolution of charged defects in the fatigue process of polycrystalline BiFeO3 thin films
title_short Microstructural evolution of charged defects in the fatigue process of polycrystalline BiFeO3 thin films
title_full Microstructural evolution of charged defects in the fatigue process of polycrystalline BiFeO3 thin films
title_fullStr Microstructural evolution of charged defects in the fatigue process of polycrystalline BiFeO3 thin films
title_full_unstemmed Microstructural evolution of charged defects in the fatigue process of polycrystalline BiFeO3 thin films
title_sort microstructural evolution of charged defects in the fatigue process of polycrystalline bifeo3 thin films
publisher Elsevier
publishDate 2016
url http://scholarbank.nus.edu.sg/handle/10635/123201
_version_ 1681095863971086336

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