Low-temperature scanning tunneling microscopy and near-edge X-ray absorption fine structure investigation of epitaxial growth of F 16CuPc thin films on graphite

Low-temperature scanning tunneling microscopy and near-edge X-ray absorption fine structure investigation of epitaxial growth of F 16CuPc thin films on graphite

10.1007/s00339-008-5000-6

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Bibliographic Details
Main Authors: Huang, Y.L., Chen, W., Chen, S., Wee, A.T.S.
Other Authors: CHEMISTRY
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/116444
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Institution: National University of Singapore
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Summary:10.1007/s00339-008-5000-6

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