Low-temperature scanning tunneling microscopy and near-edge X-ray absorption fine structure investigation of epitaxial growth of F 16CuPc thin films on graphite
10.1007/s00339-008-5000-6
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Main Authors: | Huang, Y.L., Chen, W., Chen, S., Wee, A.T.S. |
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Other Authors: | CHEMISTRY |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/116444 |
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Institution: | National University of Singapore |
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