Authenticated key exchange under bad randomness

• Main Authors: Yang, G., Duan, S., Wong, D.S., Tan, C.H., Wang, H.
• Other Authors: TEMASEK LABORATORIES
• Format: Conference or Workshop Item
• Published: 2014
• Subjects: Authenticated Key Exchange; Bad Randomness; Resettable Cryptography
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/116695
• Institution: National University of Singapore

10.1007/978-3-642-27576-0_10