Authenticated key exchange under bad randomness

10.1007/978-3-642-27576-0_10

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Bibliographic Details
Main Authors: Yang, G., Duan, S., Wong, D.S., Tan, C.H., Wang, H.
Other Authors: TEMASEK LABORATORIES
Format: Conference or Workshop Item
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/116695
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Institution: National University of Singapore
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