A broadband permeability measurement of FeTaN lamination stack by the shorted microstrip line method

A broadband permeability measurement of FeTaN lamination stack by the shorted microstrip line method

10.1063/1.3054181

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書目詳細資料
Main Authors:	Chen, X., Ma, Y., Xu, F., Wang, P., Ong, C.K.
其他作者:	TEMASEK LABORATORIES
格式:	Article
出版:	2014
在線閱讀:	http://scholarbank.nus.edu.sg/handle/10635/116900
標簽:	添加標簽沒有標簽, 成為第一個標記此記錄!

實物特徵
總結:	10.1063/1.3054181