A broadband permeability measurement of FeTaN lamination stack by the shorted microstrip line method
10.1063/1.3054181
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Main Authors: | Chen, X., Ma, Y., Xu, F., Wang, P., Ong, C.K. |
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Other Authors: | TEMASEK LABORATORIES |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/116900 |
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Institution: | National University of Singapore |
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