$Comparison of nitrogen compositions in the as-grown GaNxAs 1-x on GaAs measured by high-resolution x-ray diffraction and secondary-ion mass spectroscopy$

Comparison of nitrogen compositions in the as-grown GaNxAs 1-x on GaAs measured by high-resolution x-ray diffraction and secondary-ion mass spectroscopy

10.1063/1.1483913

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Bibliographic Details
Main Authors:	Fan, W.J., Yoon, S.F., Ng, T.K., Wang, S.Z., Loke, W.K., Liu, R., Wee, A.
Other Authors:	INSTITUTE OF ENGINEERING SCIENCE
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/116955
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Institution:	National University of Singapore

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spelling	sg-nus-scholar.10635-1169552023-10-30T20:07:16Z Comparison of nitrogen compositions in the as-grown GaNxAs 1-x on GaAs measured by high-resolution x-ray diffraction and secondary-ion mass spectroscopy Fan, W.J. Yoon, S.F. Ng, T.K. Wang, S.Z. Loke, W.K. Liu, R. Wee, A. INSTITUTE OF ENGINEERING SCIENCE PHYSICS 10.1063/1.1483913 Applied Physics Letters 80 22 4136-4138 APPLA 2014-12-12T07:59:39Z 2014-12-12T07:59:39Z 2002-06-03 Article Fan, W.J., Yoon, S.F., Ng, T.K., Wang, S.Z., Loke, W.K., Liu, R., Wee, A. (2002-06-03). Comparison of nitrogen compositions in the as-grown GaNxAs 1-x on GaAs measured by high-resolution x-ray diffraction and secondary-ion mass spectroscopy. Applied Physics Letters 80 (22) : 4136-4138. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1483913 00036951 http://scholarbank.nus.edu.sg/handle/10635/116955 000175771800018 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	10.1063/1.1483913
author2	INSTITUTE OF ENGINEERING SCIENCE
author_facet	INSTITUTE OF ENGINEERING SCIENCE Fan, W.J. Yoon, S.F. Ng, T.K. Wang, S.Z. Loke, W.K. Liu, R. Wee, A.
format	Article
author	Fan, W.J. Yoon, S.F. Ng, T.K. Wang, S.Z. Loke, W.K. Liu, R. Wee, A.
spellingShingle	Fan, W.J. Yoon, S.F. Ng, T.K. Wang, S.Z. Loke, W.K. Liu, R. Wee, A. Comparison of nitrogen compositions in the as-grown GaNxAs 1-x on GaAs measured by high-resolution x-ray diffraction and secondary-ion mass spectroscopy
author_sort	Fan, W.J.
title	Comparison of nitrogen compositions in the as-grown GaNxAs 1-x on GaAs measured by high-resolution x-ray diffraction and secondary-ion mass spectroscopy
title_short	Comparison of nitrogen compositions in the as-grown GaNxAs 1-x on GaAs measured by high-resolution x-ray diffraction and secondary-ion mass spectroscopy
title_full	Comparison of nitrogen compositions in the as-grown GaNxAs 1-x on GaAs measured by high-resolution x-ray diffraction and secondary-ion mass spectroscopy
title_fullStr	Comparison of nitrogen compositions in the as-grown GaNxAs 1-x on GaAs measured by high-resolution x-ray diffraction and secondary-ion mass spectroscopy
title_full_unstemmed	Comparison of nitrogen compositions in the as-grown GaNxAs 1-x on GaAs measured by high-resolution x-ray diffraction and secondary-ion mass spectroscopy
title_sort	comparison of nitrogen compositions in the as-grown ganxas 1-x on gaas measured by high-resolution x-ray diffraction and secondary-ion mass spectroscopy
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/116955
_version_	1781789571195863040

Comparison of nitrogen compositions in the as-grown GaNxAs 1-x on GaAs measured by high-resolution x-ray diffraction and secondary-ion mass spectroscopy

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