MATERIAL CHARACTERIZATION BY ENERGY FILTERED SECONDARY ELECTRON SIGNALS INSIDE THE SCANNING ELECTRON MICROSCOPE

Ph.D

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Main Author:	AVINASH SRINIVASAN
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Theses and Dissertations
Language:	English
Published:	2015
Subjects:	SEM, Secondary Electrons, Electron Energy Analyzer, Material Characterization, Dopant and Voltage Contrast, Multifunctional oxide interface
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/119330
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Institution:	National University of Singapore
Language:	English

id	sg-nus-scholar.10635-119330
record_format	dspace
spelling	sg-nus-scholar.10635-1193302015-09-23T20:22:03Z MATERIAL CHARACTERIZATION BY ENERGY FILTERED SECONDARY ELECTRON SIGNALS INSIDE THE SCANNING ELECTRON MICROSCOPE AVINASH SRINIVASAN ELECTRICAL & COMPUTER ENGINEERING KHURSHEED, ANJAM SEM, Secondary Electrons, Electron Energy Analyzer, Material Characterization, Dopant and Voltage Contrast, Multifunctional oxide interface Ph.D DOCTOR OF PHILOSOPHY 2015-04-09T18:00:08Z 2015-04-09T18:00:08Z 2014-08-22 Thesis AVINASH SRINIVASAN (2014-08-22). MATERIAL CHARACTERIZATION BY ENERGY FILTERED SECONDARY ELECTRON SIGNALS INSIDE THE SCANNING ELECTRON MICROSCOPE. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/119330 NOT_IN_WOS en
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
language	English
topic	SEM, Secondary Electrons, Electron Energy Analyzer, Material Characterization, Dopant and Voltage Contrast, Multifunctional oxide interface
spellingShingle	SEM, Secondary Electrons, Electron Energy Analyzer, Material Characterization, Dopant and Voltage Contrast, Multifunctional oxide interface AVINASH SRINIVASAN MATERIAL CHARACTERIZATION BY ENERGY FILTERED SECONDARY ELECTRON SIGNALS INSIDE THE SCANNING ELECTRON MICROSCOPE
description	Ph.D
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING AVINASH SRINIVASAN
format	Theses and Dissertations
author	AVINASH SRINIVASAN
author_sort	AVINASH SRINIVASAN
title	MATERIAL CHARACTERIZATION BY ENERGY FILTERED SECONDARY ELECTRON SIGNALS INSIDE THE SCANNING ELECTRON MICROSCOPE
title_short	MATERIAL CHARACTERIZATION BY ENERGY FILTERED SECONDARY ELECTRON SIGNALS INSIDE THE SCANNING ELECTRON MICROSCOPE
title_full	MATERIAL CHARACTERIZATION BY ENERGY FILTERED SECONDARY ELECTRON SIGNALS INSIDE THE SCANNING ELECTRON MICROSCOPE
title_fullStr	MATERIAL CHARACTERIZATION BY ENERGY FILTERED SECONDARY ELECTRON SIGNALS INSIDE THE SCANNING ELECTRON MICROSCOPE
title_full_unstemmed	MATERIAL CHARACTERIZATION BY ENERGY FILTERED SECONDARY ELECTRON SIGNALS INSIDE THE SCANNING ELECTRON MICROSCOPE
title_sort	material characterization by energy filtered secondary electron signals inside the scanning electron microscope
publishDate	2015
url	http://scholarbank.nus.edu.sg/handle/10635/119330
_version_	1681095541443788800

MATERIAL CHARACTERIZATION BY ENERGY FILTERED SECONDARY ELECTRON SIGNALS INSIDE THE SCANNING ELECTRON MICROSCOPE

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