Characterization of materials using the secondary electron energy spectromicroscopy technique

Characterization of materials using the secondary electron energy spectromicroscopy technique

10.1016/j.omx.2021.100121

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Bibliographic Details
Main Authors: Srinivasan, Avinash, Han, Weiding, Zheng, Minrui, Khursheed, Anjam
Other Authors: ELECTRICAL AND COMPUTER ENGINEERING
Format: Article
Published: Elsevier B.V. 2022
Subjects:
Electron energy spectroscopy
Materials characterization
pn heterojunctions
Scanning electron microscope
Secondary electrons
Semiconductor dopant concentration
Online Access:https://scholarbank.nus.edu.sg/handle/10635/233530
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Institution: National University of Singapore

Internet

https://scholarbank.nus.edu.sg/handle/10635/233530

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