Characterization of materials using the secondary electron energy spectromicroscopy technique

10.1016/j.omx.2021.100121

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Main Authors:	Srinivasan, Avinash, Han, Weiding, Zheng, Minrui, Khursheed, Anjam
Other Authors:	ELECTRICAL AND COMPUTER ENGINEERING
Format:	Article
Published:	Elsevier B.V. 2022
Subjects:	Electron energy spectroscopy Materials characterization pn heterojunctions Scanning electron microscope Secondary electrons Semiconductor dopant concentration
Online Access:	https://scholarbank.nus.edu.sg/handle/10635/233530
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-233530
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spelling	sg-nus-scholar.10635-2335302024-04-16T11:14:33Z Characterization of materials using the secondary electron energy spectromicroscopy technique Srinivasan, Avinash Han, Weiding Zheng, Minrui Khursheed, Anjam ELECTRICAL AND COMPUTER ENGINEERING COLLEGE OF DESIGN AND ENGINEERING Electron energy spectroscopy Materials characterization pn heterojunctions Scanning electron microscope Secondary electrons Semiconductor dopant concentration 10.1016/j.omx.2021.100121 Optical Materials: X 12 100121 2022-10-26T09:00:03Z 2022-10-26T09:00:03Z 2021-11-01 Article Srinivasan, Avinash, Han, Weiding, Zheng, Minrui, Khursheed, Anjam (2021-11-01). Characterization of materials using the secondary electron energy spectromicroscopy technique. Optical Materials: X 12 : 100121. ScholarBank@NUS Repository. https://doi.org/10.1016/j.omx.2021.100121 2590-1478 https://scholarbank.nus.edu.sg/handle/10635/233530 Attribution-NonCommercial-NoDerivatives 4.0 International https://creativecommons.org/licenses/by-nc-nd/4.0/ Elsevier B.V. Scopus OA2021
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
topic	Electron energy spectroscopy Materials characterization pn heterojunctions Scanning electron microscope Secondary electrons Semiconductor dopant concentration
spellingShingle	Electron energy spectroscopy Materials characterization pn heterojunctions Scanning electron microscope Secondary electrons Semiconductor dopant concentration Srinivasan, Avinash Han, Weiding Zheng, Minrui Khursheed, Anjam Characterization of materials using the secondary electron energy spectromicroscopy technique
description	10.1016/j.omx.2021.100121
author2	ELECTRICAL AND COMPUTER ENGINEERING
author_facet	ELECTRICAL AND COMPUTER ENGINEERING Srinivasan, Avinash Han, Weiding Zheng, Minrui Khursheed, Anjam
format	Article
author	Srinivasan, Avinash Han, Weiding Zheng, Minrui Khursheed, Anjam
author_sort	Srinivasan, Avinash
title	Characterization of materials using the secondary electron energy spectromicroscopy technique
title_short	Characterization of materials using the secondary electron energy spectromicroscopy technique
title_full	Characterization of materials using the secondary electron energy spectromicroscopy technique
title_fullStr	Characterization of materials using the secondary electron energy spectromicroscopy technique
title_full_unstemmed	Characterization of materials using the secondary electron energy spectromicroscopy technique
title_sort	characterization of materials using the secondary electron energy spectromicroscopy technique
publisher	Elsevier B.V.
publishDate	2022
url	https://scholarbank.nus.edu.sg/handle/10635/233530
_version_	1800915676389441536

Characterization of materials using the secondary electron energy spectromicroscopy technique

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