Characterization of materials using the secondary electron energy spectromicroscopy technique
10.1016/j.omx.2021.100121
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Main Authors: | Srinivasan, Avinash, Han, Weiding, Zheng, Minrui, Khursheed, Anjam |
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Other Authors: | ELECTRICAL AND COMPUTER ENGINEERING |
Format: | Article |
Published: |
Elsevier B.V.
2022
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Online Access: | https://scholarbank.nus.edu.sg/handle/10635/233530 |
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Institution: | National University of Singapore |
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