Nanoscale magnetization reversal caused by electric field-induced ion migration and redistribution in cobalt ferrite thin films
10.1021/acsnano.5b00456
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Main Authors: | Chen, Xinxin, Zhu, Xiaojian, Xiao, Wen, Liu, Gang, Feng, Yuan Ping, Ding, Jun, Li, Runwei |
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Other Authors: | MATERIALS SCIENCE AND ENGINEERING |
Format: | Article |
Published: |
American Chemical Society
2016
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/123190 |
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Institution: | National University of Singapore |
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