Nanoscale magnetization reversal caused by electric field-induced ion migration and redistribution in cobalt ferrite thin films

10.1021/acsnano.5b00456

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Bibliographic Details
Main Authors: Chen, Xinxin, Zhu, Xiaojian, Xiao, Wen, Liu, Gang, Feng, Yuan Ping, Ding, Jun, Li, Runwei
Other Authors: MATERIALS SCIENCE AND ENGINEERING
Format: Article
Published: American Chemical Society 2016
Online Access:http://scholarbank.nus.edu.sg/handle/10635/123190
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Institution: National University of Singapore
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