A Bayesian approach to condition monitoring with imperfect inspections

10.1002/qre.1609

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Bibliographic Details
Main Authors: Ye, Zhisheng, Chen, Nan, Tsui, Kwokleung
Other Authors: INDUSTRIAL & SYSTEMS ENGINEERING
Format: Article
Published: John Wiley and Sons Ltd 2016
Online Access:http://scholarbank.nus.edu.sg/handle/10635/123600
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-1236002023-10-26T20:28:13Z A Bayesian approach to condition monitoring with imperfect inspections Ye, Zhisheng Chen, Nan Tsui, Kwokleung INDUSTRIAL & SYSTEMS ENGINEERING 10.1002/qre.1609 Quality and Reliability Engineering International 31 3 513-522 2016-04-29T08:31:19Z 2016-04-29T08:31:19Z 2015 Article Ye, Zhisheng, Chen, Nan, Tsui, Kwokleung (2015). A Bayesian approach to condition monitoring with imperfect inspections. Quality and Reliability Engineering International 31 (3) : 513-522. ScholarBank@NUS Repository. https://doi.org/10.1002/qre.1609 07488017 http://scholarbank.nus.edu.sg/handle/10635/123600 000351434200015 John Wiley and Sons Ltd
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description 10.1002/qre.1609
author2 INDUSTRIAL & SYSTEMS ENGINEERING
author_facet INDUSTRIAL & SYSTEMS ENGINEERING
Ye, Zhisheng
Chen, Nan
Tsui, Kwokleung
format Article
author Ye, Zhisheng
Chen, Nan
Tsui, Kwokleung
spellingShingle Ye, Zhisheng
Chen, Nan
Tsui, Kwokleung
A Bayesian approach to condition monitoring with imperfect inspections
author_sort Ye, Zhisheng
title A Bayesian approach to condition monitoring with imperfect inspections
title_short A Bayesian approach to condition monitoring with imperfect inspections
title_full A Bayesian approach to condition monitoring with imperfect inspections
title_fullStr A Bayesian approach to condition monitoring with imperfect inspections
title_full_unstemmed A Bayesian approach to condition monitoring with imperfect inspections
title_sort bayesian approach to condition monitoring with imperfect inspections
publisher John Wiley and Sons Ltd
publishDate 2016
url http://scholarbank.nus.edu.sg/handle/10635/123600
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