A Bayesian approach to condition monitoring with imperfect inspections

10.1002/qre.1609

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Bibliographic Details
Main Authors: Ye, Zhisheng, Chen, Nan, Tsui, Kwokleung
Other Authors: INDUSTRIAL & SYSTEMS ENGINEERING
Format: Article
Published: John Wiley and Sons Ltd 2016
Online Access:http://scholarbank.nus.edu.sg/handle/10635/123600
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Institution: National University of Singapore

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