Defect scaling with contact area in EGaIn-based junctions: Impact on quality, Joule heating, and apparent injection current
10.1021/jp511002b
Saved in:
| Main Authors: | , , , , |
|---|---|
| Other Authors: | |
| Format: | Article |
| Published: |
American Chemical Society
2016
|
| Online Access: | http://scholarbank.nus.edu.sg/handle/10635/127557 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Institution: | National University of Singapore |