Defect scaling with contact area in EGaIn-based junctions: Impact on quality, Joule heating, and apparent injection current

Defect scaling with contact area in EGaIn-based junctions: Impact on quality, Joule heating, and apparent injection current

10.1021/jp511002b

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Main Authors: Jiang Le, Sangeeth C.S.S., Wan Albert, Vilan Ayelet, Nijhuis Christian Albertus
Other Authors: CHEMISTRY
Format: Article
Published: American Chemical Society 2016
Online Access:http://scholarbank.nus.edu.sg/handle/10635/127557
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-1275572023-10-26T21:44:36Z Defect scaling with contact area in EGaIn-based junctions: Impact on quality, Joule heating, and apparent injection current Jiang Le Sangeeth C.S.S. Wan Albert Vilan Ayelet Nijhuis Christian Albertus CHEMISTRY 10.1021/jp511002b Journal of Physical Chemistry C 119 2 960-969 2016-09-09T01:00:46Z 2016-09-09T01:00:46Z 2015 Article Jiang Le, Sangeeth C.S.S., Wan Albert, Vilan Ayelet, Nijhuis Christian Albertus (2015). Defect scaling with contact area in EGaIn-based junctions: Impact on quality, Joule heating, and apparent injection current. Journal of Physical Chemistry C 119 (2) : 960-969. ScholarBank@NUS Repository. https://doi.org/10.1021/jp511002b 19327447 http://scholarbank.nus.edu.sg/handle/10635/127557 000348094000011 American Chemical Society
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description 10.1021/jp511002b
author2 CHEMISTRY
author_facet CHEMISTRY
Jiang Le
Sangeeth C.S.S.
Wan Albert
Vilan Ayelet
Nijhuis Christian Albertus
format Article
author Jiang Le
Sangeeth C.S.S.
Wan Albert
Vilan Ayelet
Nijhuis Christian Albertus
spellingShingle Jiang Le
Sangeeth C.S.S.
Wan Albert
Vilan Ayelet
Nijhuis Christian Albertus
Defect scaling with contact area in EGaIn-based junctions: Impact on quality, Joule heating, and apparent injection current
author_sort Jiang Le
title Defect scaling with contact area in EGaIn-based junctions: Impact on quality, Joule heating, and apparent injection current
title_short Defect scaling with contact area in EGaIn-based junctions: Impact on quality, Joule heating, and apparent injection current
title_full Defect scaling with contact area in EGaIn-based junctions: Impact on quality, Joule heating, and apparent injection current
title_fullStr Defect scaling with contact area in EGaIn-based junctions: Impact on quality, Joule heating, and apparent injection current
title_full_unstemmed Defect scaling with contact area in EGaIn-based junctions: Impact on quality, Joule heating, and apparent injection current
title_sort defect scaling with contact area in egain-based junctions: impact on quality, joule heating, and apparent injection current
publisher American Chemical Society
publishDate 2016
url http://scholarbank.nus.edu.sg/handle/10635/127557
_version_ 1781790407497089024

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