Moment reversal characterization of thin magnetic film by VSM or AGFM

Moment reversal characterization of thin magnetic film by VSM or AGFM

10.1109/20.951016

Saved in:
Bibliographic Details
Main Authors: Shan, Z.S., Xu, Y., Wang, J.P., Chong, T.C., Malhotra, S.S., Staffort, D.C., Zhu, C.X.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2016
Subjects:
Anisotropy
Moment-decay
Switching volume
Thermal stability factor
Online Access:http://scholarbank.nus.edu.sg/handle/10635/131605
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore
Description
Summary:10.1109/20.951016

Similar Items