Moment reversal characterization of thin magnetic film by VSM or AGFM

• Main Authors: Shan, Z.S., Xu, Y., Wang, J.P., Chong, T.C., Malhotra, S.S., Staffort, D.C., Zhu, C.X.
• Other Authors: ELECTRICAL & COMPUTER ENGINEERING
• Format: Conference or Workshop Item
• Published: 2016
• Subjects: Anisotropy; Moment-decay; Switching volume; Thermal stability factor
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/131605
• Institution: National University of Singapore

10.1109/20.951016