Reliability and characterization for deep sub-micron CMOS devices

Ph.D

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Bibliographic Details
Main Author:	CHEN GANG
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Theses and Dissertations
Language:	English
Published:	2010
Subjects:	CMOS, reliability, characterization, interface state, hot carrier, NBTI
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/13571
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Institution:	National University of Singapore
Language:	English

id	sg-nus-scholar.10635-13571
record_format	dspace
spelling	sg-nus-scholar.10635-135712015-01-16T14:35:51Z Reliability and characterization for deep sub-micron CMOS devices CHEN GANG ELECTRICAL & COMPUTER ENGINEERING LI MING-FU CMOS, reliability, characterization, interface state, hot carrier, NBTI Ph.D DOCTOR OF PHILOSOPHY 2010-04-08T10:34:20Z 2010-04-08T10:34:20Z 2003-12-09 Thesis CHEN GANG (2003-12-09). Reliability and characterization for deep sub-micron CMOS devices. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/13571 NOT_IN_WOS en
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
language	English
topic	CMOS, reliability, characterization, interface state, hot carrier, NBTI
spellingShingle	CMOS, reliability, characterization, interface state, hot carrier, NBTI CHEN GANG Reliability and characterization for deep sub-micron CMOS devices
description	Ph.D
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING CHEN GANG
format	Theses and Dissertations
author	CHEN GANG
author_sort	CHEN GANG
title	Reliability and characterization for deep sub-micron CMOS devices
title_short	Reliability and characterization for deep sub-micron CMOS devices
title_full	Reliability and characterization for deep sub-micron CMOS devices
title_fullStr	Reliability and characterization for deep sub-micron CMOS devices
title_full_unstemmed	Reliability and characterization for deep sub-micron CMOS devices
title_sort	reliability and characterization for deep sub-micron cmos devices
publishDate	2010
url	http://scholarbank.nus.edu.sg/handle/10635/13571
_version_	1681078880536887296

Reliability and characterization for deep sub-micron CMOS devices

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