Reliability and characterization for deep sub-micron CMOS devices

Ph.D

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Main Author: CHEN GANG
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Theses and Dissertations
Language:English
Published: 2010
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/13571
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Institution: National University of Singapore
Language: English
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spelling sg-nus-scholar.10635-135712024-10-26T03:02:49Z Reliability and characterization for deep sub-micron CMOS devices CHEN GANG ELECTRICAL & COMPUTER ENGINEERING LI MING-FU CMOS, reliability, characterization, interface state, hot carrier, NBTI Ph.D DOCTOR OF PHILOSOPHY 2010-04-08T10:34:20Z 2010-04-08T10:34:20Z 2003-12-09 Thesis CHEN GANG (2003-12-09). Reliability and characterization for deep sub-micron CMOS devices. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/13571 NOT_IN_WOS en
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
language English
topic CMOS, reliability, characterization, interface state, hot carrier, NBTI
spellingShingle CMOS, reliability, characterization, interface state, hot carrier, NBTI
CHEN GANG
Reliability and characterization for deep sub-micron CMOS devices
description Ph.D
author2 ELECTRICAL & COMPUTER ENGINEERING
author_facet ELECTRICAL & COMPUTER ENGINEERING
CHEN GANG
format Theses and Dissertations
author CHEN GANG
author_sort CHEN GANG
title Reliability and characterization for deep sub-micron CMOS devices
title_short Reliability and characterization for deep sub-micron CMOS devices
title_full Reliability and characterization for deep sub-micron CMOS devices
title_fullStr Reliability and characterization for deep sub-micron CMOS devices
title_full_unstemmed Reliability and characterization for deep sub-micron CMOS devices
title_sort reliability and characterization for deep sub-micron cmos devices
publishDate 2010
url http://scholarbank.nus.edu.sg/handle/10635/13571
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