Analysis of the DCIV peaks in electrically stressed pMOSFETs

10.1109/16.918239

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Bibliographic Details
Main Authors: Jie, B.B., Chim, W.K., Li, M.-F., Lo, K.F.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/55095
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Institution: National University of Singapore