Analysis of the DCIV peaks in electrically stressed pMOSFETs

Analysis of the DCIV peaks in electrically stressed pMOSFETs

10.1109/16.918239

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Bibliographic Details
Main Authors: Jie, B.B., Chim, W.K., Li, M.-F., Lo, K.F.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Subjects:
CMOSFETs
Hot carrier
Reliability
Semiconductor-insulator interface
Online Access:http://scholarbank.nus.edu.sg/handle/10635/55095
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-550952015-01-31T06:37:52Z Analysis of the DCIV peaks in electrically stressed pMOSFETs Jie, B.B. Chim, W.K. Li, M.-F. Lo, K.F. ELECTRICAL & COMPUTER ENGINEERING CMOSFETs Hot carrier Reliability Semiconductor-insulator interface 10.1109/16.918239 IEEE Transactions on Electron Devices 48 5 913-920 IETDA 2014-06-17T02:39:07Z 2014-06-17T02:39:07Z 2001-05 Article Jie, B.B.,Chim, W.K.,Li, M.-F.,Lo, K.F. (2001-05). Analysis of the DCIV peaks in electrically stressed pMOSFETs. IEEE Transactions on Electron Devices 48 (5) : 913-920. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/16.918239" target="_blank">https://doi.org/10.1109/16.918239</a> 00189383 http://scholarbank.nus.edu.sg/handle/10635/55095 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
topic CMOSFETs
Hot carrier
Reliability
Semiconductor-insulator interface
spellingShingle CMOSFETs
Hot carrier
Reliability
Semiconductor-insulator interface
Jie, B.B.
Chim, W.K.
Li, M.-F.
Lo, K.F.
Analysis of the DCIV peaks in electrically stressed pMOSFETs
description 10.1109/16.918239
author2 ELECTRICAL & COMPUTER ENGINEERING
author_facet ELECTRICAL & COMPUTER ENGINEERING
Jie, B.B.
Chim, W.K.
Li, M.-F.
Lo, K.F.
format Article
author Jie, B.B.
Chim, W.K.
Li, M.-F.
Lo, K.F.
author_sort Jie, B.B.
title Analysis of the DCIV peaks in electrically stressed pMOSFETs
title_short Analysis of the DCIV peaks in electrically stressed pMOSFETs
title_full Analysis of the DCIV peaks in electrically stressed pMOSFETs
title_fullStr Analysis of the DCIV peaks in electrically stressed pMOSFETs
title_full_unstemmed Analysis of the DCIV peaks in electrically stressed pMOSFETs
title_sort analysis of the dciv peaks in electrically stressed pmosfets
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/55095
_version_ 1681084436229128192

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