Analysis of the DCIV peaks in electrically stressed pMOSFETs

10.1109/16.918239

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Bibliographic Details
Main Authors:	Jie, B.B., Chim, W.K., Li, M.-F., Lo, K.F.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Article
Published:	2014
Subjects:	CMOSFETs Hot carrier Reliability Semiconductor-insulator interface
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/55095
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Institution:	National University of Singapore

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Summary:	10.1109/16.918239

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