Analysis of the DCIV peaks in electrically stressed pMOSFETs
10.1109/16.918239
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Main Authors: | Jie, B.B., Chim, W.K., Li, M.-F., Lo, K.F. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Article |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/55095 |
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Institution: | National University of Singapore |
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