Quantum mechanical modeling of capacitance and gate current for MIS structures using zirconium dioxide as the gate dielectric

IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE

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Bibliographic Details
Main Authors: Koh, B.H., Ng, T.H., Zheng, J.X., Chim, W.K., Choi, W.K.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/84120
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Institution: National University of Singapore