Direct observations of nickel silicide formation on (100) Si and Si0.75Ge0.25 substrates using in-situ transmission electron microscopy

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Main Author: RAMESH NATH S/O PREMNATH
Other Authors: MATERIALS SCIENCE
Format: Theses and Dissertations
Language:English
Published: 2010
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/14427
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Institution: National University of Singapore
Language: English
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spelling sg-nus-scholar.10635-144272024-10-25T18:54:26Z Direct observations of nickel silicide formation on (100) Si and Si0.75Ge0.25 substrates using in-situ transmission electron microscopy RAMESH NATH S/O PREMNATH MATERIALS SCIENCE MARK YEADON nickel silicide, transmission electron microscope, in situ, agglomeration, nucleation, surface relaxation Master's MASTER OF SCIENCE 2010-04-08T10:43:05Z 2010-04-08T10:43:05Z 2005-03-11 Thesis RAMESH NATH S/O PREMNATH (2005-03-11). Direct observations of nickel silicide formation on (100) Si and Si0.75Ge0.25 substrates using in-situ transmission electron microscopy. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/14427 NOT_IN_WOS en
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
language English
topic nickel silicide, transmission electron microscope, in situ, agglomeration, nucleation, surface relaxation
spellingShingle nickel silicide, transmission electron microscope, in situ, agglomeration, nucleation, surface relaxation
RAMESH NATH S/O PREMNATH
Direct observations of nickel silicide formation on (100) Si and Si0.75Ge0.25 substrates using in-situ transmission electron microscopy
description Master's
author2 MATERIALS SCIENCE
author_facet MATERIALS SCIENCE
RAMESH NATH S/O PREMNATH
format Theses and Dissertations
author RAMESH NATH S/O PREMNATH
author_sort RAMESH NATH S/O PREMNATH
title Direct observations of nickel silicide formation on (100) Si and Si0.75Ge0.25 substrates using in-situ transmission electron microscopy
title_short Direct observations of nickel silicide formation on (100) Si and Si0.75Ge0.25 substrates using in-situ transmission electron microscopy
title_full Direct observations of nickel silicide formation on (100) Si and Si0.75Ge0.25 substrates using in-situ transmission electron microscopy
title_fullStr Direct observations of nickel silicide formation on (100) Si and Si0.75Ge0.25 substrates using in-situ transmission electron microscopy
title_full_unstemmed Direct observations of nickel silicide formation on (100) Si and Si0.75Ge0.25 substrates using in-situ transmission electron microscopy
title_sort direct observations of nickel silicide formation on (100) si and si0.75ge0.25 substrates using in-situ transmission electron microscopy
publishDate 2010
url http://scholarbank.nus.edu.sg/handle/10635/14427
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