THE EFFECTS OF R&D EXPENDITURE AND PATENTS ON SYSTEMATIC, IDIOSYNCRATIC AND STOCK PRICE CRASH RISK

Bachelor's

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Bibliographic Details
Main Author: ONN WEI CHENG
Other Authors: NUS Business School
Format: Theses and Dissertations
Published: 2018
Online Access:http://scholarbank.nus.edu.sg/handle/10635/147518
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Institution: National University of Singapore
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Summary:Bachelor's