THE EFFECTS OF R&D EXPENDITURE AND PATENTS ON SYSTEMATIC, IDIOSYNCRATIC AND STOCK PRICE CRASH RISK
Bachelor's
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Main Author: | ONN WEI CHENG |
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Other Authors: | NUS Business School |
Format: | Theses and Dissertations |
Published: |
2018
|
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/147518 |
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Institution: | National University of Singapore |
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