Temperature regulation and in-situ fault detection of wafer warpage

Master's

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Main Author: CHEN WEI
Other Authors: MECHANICAL ENGINEERING
Format: Theses and Dissertations
Language:English
Published: 2010
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/14831
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Institution: National University of Singapore
Language: English
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spelling sg-nus-scholar.10635-148312017-10-21T05:52:47Z Temperature regulation and in-situ fault detection of wafer warpage CHEN WEI MECHANICAL ENGINEERING YAP, CHRISTOPHER ROBERT HO WENG KHUEN Wafer warpage, Fault detection,Feedforward, Temperature control,Lithogrophy,Semiconductor manufacturing Master's MASTER OF ENGINEERING 2010-04-08T10:47:16Z 2010-04-08T10:47:16Z 2005-06-07 Thesis CHEN WEI (2005-06-07). Temperature regulation and in-situ fault detection of wafer warpage. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/14831 NOT_IN_WOS en
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
language English
topic Wafer warpage, Fault detection,Feedforward, Temperature control,Lithogrophy,Semiconductor manufacturing
spellingShingle Wafer warpage, Fault detection,Feedforward, Temperature control,Lithogrophy,Semiconductor manufacturing
CHEN WEI
Temperature regulation and in-situ fault detection of wafer warpage
description Master's
author2 MECHANICAL ENGINEERING
author_facet MECHANICAL ENGINEERING
CHEN WEI
format Theses and Dissertations
author CHEN WEI
author_sort CHEN WEI
title Temperature regulation and in-situ fault detection of wafer warpage
title_short Temperature regulation and in-situ fault detection of wafer warpage
title_full Temperature regulation and in-situ fault detection of wafer warpage
title_fullStr Temperature regulation and in-situ fault detection of wafer warpage
title_full_unstemmed Temperature regulation and in-situ fault detection of wafer warpage
title_sort temperature regulation and in-situ fault detection of wafer warpage
publishDate 2010
url http://scholarbank.nus.edu.sg/handle/10635/14831
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