Directed self-assembly of ge quantum dots using focused Si2+ ion beam patterning

Directed self-assembly of ge quantum dots using focused Si2+ ion beam patterning

10.1038/s41598-018-27512-z

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Bibliographic Details
Main Authors: Chee S.W., Kammler M., Graham J., Gignac L., Reuter M.C., Hull R., Ross F.M.
Other Authors: BIOLOGICAL SCIENCES
Format: Article
Published: Nature Publishing Group 2019
Online Access:http://scholarbank.nus.edu.sg/handle/10635/152426
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Institution: National University of Singapore

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http://scholarbank.nus.edu.sg/handle/10635/152426

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