INVESTIGATION ON IDDQ FAILURES
Master's
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sg-nus-scholar.10635-1539762024-10-26T00:11:13Z INVESTIGATION ON IDDQ FAILURES JONATHAN LIM TZE MING SINGAPORE-MIT ALLIANCE CHIM WAI KIN CHAN YEE MING NEOH CHIA LEE IDDQ leakage current CMOS NMOS submicron short-channel effect dislocation ion implantation amorphization recrystallization Master's MASTER OF SCIENCE IN ADVANCED MATERIALS FOR MICRO- & NANO- SYSTEMS Dissertation Supervisors: 1. Associate Professor Chim Wai Kin, SMA Fellow, National University of Singapore. 2. Dr. Chan Yee Ming, Principal Engineer, Systems on Silicon Manufacturing Co. 3. Ms. Neoh Chia Lee, Senior Engineer, Systems on Silicon Manufacturing Co. 2019-05-10T05:31:57Z 2019-05-10T05:31:57Z 2006 Thesis JONATHAN LIM TZE MING (2006). INVESTIGATION ON IDDQ FAILURES. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/153976 SMA BATCHLOAD 20190422 |
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IDDQ leakage current CMOS NMOS submicron short-channel effect dislocation ion implantation amorphization recrystallization |
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IDDQ leakage current CMOS NMOS submicron short-channel effect dislocation ion implantation amorphization recrystallization JONATHAN LIM TZE MING INVESTIGATION ON IDDQ FAILURES |
description |
Master's |
author2 |
SINGAPORE-MIT ALLIANCE |
author_facet |
SINGAPORE-MIT ALLIANCE JONATHAN LIM TZE MING |
format |
Theses and Dissertations |
author |
JONATHAN LIM TZE MING |
author_sort |
JONATHAN LIM TZE MING |
title |
INVESTIGATION ON IDDQ FAILURES |
title_short |
INVESTIGATION ON IDDQ FAILURES |
title_full |
INVESTIGATION ON IDDQ FAILURES |
title_fullStr |
INVESTIGATION ON IDDQ FAILURES |
title_full_unstemmed |
INVESTIGATION ON IDDQ FAILURES |
title_sort |
investigation on iddq failures |
publishDate |
2019 |
url |
https://scholarbank.nus.edu.sg/handle/10635/153976 |
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1821192262841794560 |