INVESTIGATION ON IDDQ FAILURES

INVESTIGATION ON IDDQ FAILURES

Master's

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Bibliographic Details
Main Author:	JONATHAN LIM TZE MING
Other Authors:	SINGAPORE-MIT ALLIANCE
Format:	Theses and Dissertations
Published:	2019
Subjects:	IDDQ leakage current CMOS NMOS submicron short-channel effect dislocation ion implantation amorphization recrystallization
Online Access:	https://scholarbank.nus.edu.sg/handle/10635/153976
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Institution:	National University of Singapore

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