A COMPARATIVE STUDY OF RELIABILITY IN THIN GATE OXIDES SUBJECTED TO ELECTRON-BEAM IRRADIATION AND TO ELECTRICAL STRESS
Master's
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| Format: | Theses and Dissertations |
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2019
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| Online Access: | https://scholarbank.nus.edu.sg/handle/10635/158745 |
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sg-nus-scholar.10635-1587452019-09-16T13:10:42Z A COMPARATIVE STUDY OF RELIABILITY IN THIN GATE OXIDES SUBJECTED TO ELECTRON-BEAM IRRADIATION AND TO ELECTRICAL STRESS CHONG PEI FEN DEPT OF ELECTRICAL & COMPUTER ENGG CHO BYUNG JIN CHOR ENG FONG Master's MASTER OF ENGINEERING 2019-09-16T02:37:04Z 2019-09-16T02:37:04Z 2001 Thesis CHONG PEI FEN (2001). A COMPARATIVE STUDY OF RELIABILITY IN THIN GATE OXIDES SUBJECTED TO ELECTRON-BEAM IRRADIATION AND TO ELECTRICAL STRESS. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/158745 CCK BATCHLOAD 20190911 |
| institution |
National University of Singapore |
| building |
NUS Library |
| country |
Singapore |
| collection |
ScholarBank@NUS |
| description |
Master's |
| author2 |
DEPT OF ELECTRICAL & COMPUTER ENGG |
| author_facet |
DEPT OF ELECTRICAL & COMPUTER ENGG CHONG PEI FEN |
| format |
Theses and Dissertations |
| author |
CHONG PEI FEN |
| spellingShingle |
CHONG PEI FEN A COMPARATIVE STUDY OF RELIABILITY IN THIN GATE OXIDES SUBJECTED TO ELECTRON-BEAM IRRADIATION AND TO ELECTRICAL STRESS |
| author_sort |
CHONG PEI FEN |
| title |
A COMPARATIVE STUDY OF RELIABILITY IN THIN GATE OXIDES SUBJECTED TO ELECTRON-BEAM IRRADIATION AND TO ELECTRICAL STRESS |
| title_short |
A COMPARATIVE STUDY OF RELIABILITY IN THIN GATE OXIDES SUBJECTED TO ELECTRON-BEAM IRRADIATION AND TO ELECTRICAL STRESS |
| title_full |
A COMPARATIVE STUDY OF RELIABILITY IN THIN GATE OXIDES SUBJECTED TO ELECTRON-BEAM IRRADIATION AND TO ELECTRICAL STRESS |
| title_fullStr |
A COMPARATIVE STUDY OF RELIABILITY IN THIN GATE OXIDES SUBJECTED TO ELECTRON-BEAM IRRADIATION AND TO ELECTRICAL STRESS |
| title_full_unstemmed |
A COMPARATIVE STUDY OF RELIABILITY IN THIN GATE OXIDES SUBJECTED TO ELECTRON-BEAM IRRADIATION AND TO ELECTRICAL STRESS |
| title_sort |
comparative study of reliability in thin gate oxides subjected to electron-beam irradiation and to electrical stress |
| publishDate |
2019 |
| url |
https://scholarbank.nus.edu.sg/handle/10635/158745 |
| _version_ |
1681099842328199168 |