Material structure, properties, and dynamics through scanning transmission electron microscopy

Material structure, properties, and dynamics through scanning transmission electron microscopy

10.1186/s40543-018-0142-4

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Bibliographic Details
Main Authors:	Pennycook, S.J., Li, C., Li, M., Tang, C., Okunishi, E., Varela, M., Kim, Y.-M., Jang, J.H.e
Other Authors:	MATERIALS SCIENCE AND ENGINEERING
Format:	Conference or Workshop Item
Published:	Springer 2020
Subjects:	Electron energy loss spectroscopy Energy loss near-edge fine structure Energy-dispersive X-ray spectroscopy Ferroelectric domain structures Lead-free piezoelectrics Nanofabrication Point defect dynamics Scanning transmission electron microscopy
Online Access:	https://scholarbank.nus.edu.sg/handle/10635/168573
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Institution:	National University of Singapore

Description
Summary:	10.1186/s40543-018-0142-4