Investigation of the thickness effect on material and surface texturing properties of sputtered ZnO:Al films for thin-film Si solar cell applications

10.1016/j.vacuum.2015.10.027

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Bibliographic Details
Main Authors: Yan, Xia, Li, Weimin, Aberle, Armin G, Venkataraj, Selvaraj
Other Authors: ELECTRICAL AND COMPUTER ENGINEERING
Format: Article
Language:English
Published: PERGAMON-ELSEVIER SCIENCE LTD 2020
Subjects:
AL
Online Access:https://scholarbank.nus.edu.sg/handle/10635/171643
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Institution: National University of Singapore
Language: English
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