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 _    _     _____     _____     _____     _  __  
| |  | ||  |  ___||  /  ___||  |  ___||  | |/ // 
| |/\| ||  | ||__   | // __    | ||__    | ' //  
|  /\  ||  | ||__   | \\_\ ||  | ||__    | . \\  
|_// \_||  |_____||  \____//   |_____||  |_|\_\\ 
`-`   `-`  `-----`    `---`    `-----`   `-` --`

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Text this: NEW TECHNIQUES FOR THE CHARACTERIZATION OF HOT-CARRIER DEGRADATION IN MOS DEVICES