HOT-CARRIER DEGRADATION STUDY IN MOSFET'S BY CHARGE PUMPING, GATED-DIODE AND FLOATING GATE TECHNIQUES
Master's
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sg-nus-scholar.10635-1746752020-11-19T13:57:14Z HOT-CARRIER DEGRADATION STUDY IN MOSFET'S BY CHARGE PUMPING, GATED-DIODE AND FLOATING GATE TECHNIQUES GOH YONG HAN ELECTRICAL ENGINEERING C.H. LING Master's MASTER OF ENGINEERING 2020-09-08T08:50:49Z 2020-09-08T08:50:49Z 1998 Thesis GOH YONG HAN (1998). HOT-CARRIER DEGRADATION STUDY IN MOSFET'S BY CHARGE PUMPING, GATED-DIODE AND FLOATING GATE TECHNIQUES. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/174675 CCK BATCHLOAD 20200918 |
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Master's |
author2 |
ELECTRICAL ENGINEERING |
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ELECTRICAL ENGINEERING GOH YONG HAN |
format |
Theses and Dissertations |
author |
GOH YONG HAN |
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GOH YONG HAN HOT-CARRIER DEGRADATION STUDY IN MOSFET'S BY CHARGE PUMPING, GATED-DIODE AND FLOATING GATE TECHNIQUES |
author_sort |
GOH YONG HAN |
title |
HOT-CARRIER DEGRADATION STUDY IN MOSFET'S BY CHARGE PUMPING, GATED-DIODE AND FLOATING GATE TECHNIQUES |
title_short |
HOT-CARRIER DEGRADATION STUDY IN MOSFET'S BY CHARGE PUMPING, GATED-DIODE AND FLOATING GATE TECHNIQUES |
title_full |
HOT-CARRIER DEGRADATION STUDY IN MOSFET'S BY CHARGE PUMPING, GATED-DIODE AND FLOATING GATE TECHNIQUES |
title_fullStr |
HOT-CARRIER DEGRADATION STUDY IN MOSFET'S BY CHARGE PUMPING, GATED-DIODE AND FLOATING GATE TECHNIQUES |
title_full_unstemmed |
HOT-CARRIER DEGRADATION STUDY IN MOSFET'S BY CHARGE PUMPING, GATED-DIODE AND FLOATING GATE TECHNIQUES |
title_sort |
hot-carrier degradation study in mosfet's by charge pumping, gated-diode and floating gate techniques |
publishDate |
2020 |
url |
https://scholarbank.nus.edu.sg/handle/10635/174675 |
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1686108866882830336 |