HOT-CARRIER DEGRADATION STUDY IN MOSFET'S BY CHARGE PUMPING, GATED-DIODE AND FLOATING GATE TECHNIQUES

Master's

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Main Author: GOH YONG HAN
Other Authors: ELECTRICAL ENGINEERING
Format: Theses and Dissertations
Published: 2020
Online Access:https://scholarbank.nus.edu.sg/handle/10635/174675
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-1746752020-11-19T13:57:14Z HOT-CARRIER DEGRADATION STUDY IN MOSFET'S BY CHARGE PUMPING, GATED-DIODE AND FLOATING GATE TECHNIQUES GOH YONG HAN ELECTRICAL ENGINEERING C.H. LING Master's MASTER OF ENGINEERING 2020-09-08T08:50:49Z 2020-09-08T08:50:49Z 1998 Thesis GOH YONG HAN (1998). HOT-CARRIER DEGRADATION STUDY IN MOSFET'S BY CHARGE PUMPING, GATED-DIODE AND FLOATING GATE TECHNIQUES. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/174675 CCK BATCHLOAD 20200918
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description Master's
author2 ELECTRICAL ENGINEERING
author_facet ELECTRICAL ENGINEERING
GOH YONG HAN
format Theses and Dissertations
author GOH YONG HAN
spellingShingle GOH YONG HAN
HOT-CARRIER DEGRADATION STUDY IN MOSFET'S BY CHARGE PUMPING, GATED-DIODE AND FLOATING GATE TECHNIQUES
author_sort GOH YONG HAN
title HOT-CARRIER DEGRADATION STUDY IN MOSFET'S BY CHARGE PUMPING, GATED-DIODE AND FLOATING GATE TECHNIQUES
title_short HOT-CARRIER DEGRADATION STUDY IN MOSFET'S BY CHARGE PUMPING, GATED-DIODE AND FLOATING GATE TECHNIQUES
title_full HOT-CARRIER DEGRADATION STUDY IN MOSFET'S BY CHARGE PUMPING, GATED-DIODE AND FLOATING GATE TECHNIQUES
title_fullStr HOT-CARRIER DEGRADATION STUDY IN MOSFET'S BY CHARGE PUMPING, GATED-DIODE AND FLOATING GATE TECHNIQUES
title_full_unstemmed HOT-CARRIER DEGRADATION STUDY IN MOSFET'S BY CHARGE PUMPING, GATED-DIODE AND FLOATING GATE TECHNIQUES
title_sort hot-carrier degradation study in mosfet's by charge pumping, gated-diode and floating gate techniques
publishDate 2020
url https://scholarbank.nus.edu.sg/handle/10635/174675
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