HOT-CARRIER DEGRADATION STUDY IN MOSFET'S BY CHARGE PUMPING, GATED-DIODE AND FLOATING GATE TECHNIQUES
Master's
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| Format: | Theses and Dissertations |
| Published: |
2020
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| Online Access: | https://scholarbank.nus.edu.sg/handle/10635/174675 |
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| Institution: | National University of Singapore |