Charge-pumping studies of hot-carrier effects in submicrometer PMOSFETs

• Main Author: Ang, Chew Hoe
• Other Authors: Wong, Terence Kin Shun
• Format: Theses and Dissertations
• Language: English
• Published: 2009
• Subjects: DRNTU::Engineering::Electrical and electronic engineering::Electronic circuits
• Online Access: http://hdl.handle.net/10356/19732
• Institution: Nanyang Technological University

In this study, a constant amplitude charge-pumping (CP) measurement system was successfully setup. This system was used to analyse hot-carrier effects in submicrometer p-channel MOSFETs (metal-oxide-semiconductor field effect transistor) during hot-carrier stress and after termination of hot-carrier...