Charge-pumping studies of hot-carrier effects in submicrometer PMOSFETs

• المؤلف الرئيسي: Ang, Chew Hoe
• مؤلفون آخرون: Wong, Terence Kin Shun
• التنسيق: Theses and Dissertations
• اللغة: English
• منشور في: 2009
• الموضوعات: DRNTU::Engineering::Electrical and electronic engineering::Electronic circuits
• الوصول للمادة أونلاين: http://hdl.handle.net/10356/19732
• المؤسسة: Nanyang Technological University

In this study, a constant amplitude charge-pumping (CP) measurement system was successfully setup. This system was used to analyse hot-carrier effects in submicrometer p-channel MOSFETs (metal-oxide-semiconductor field effect transistor) during hot-carrier stress and after termination of hot-carrier...