Charge-pumping studies of hot-carrier effects in submicrometer PMOSFETs

• 主要作者: Ang, Chew Hoe
• 其他作者: Wong, Terence Kin Shun
• 格式: Theses and Dissertations
• 語言: English
• 出版: 2009
• 主題: DRNTU::Engineering::Electrical and electronic engineering::Electronic circuits
• 在線閱讀: http://hdl.handle.net/10356/19732
• 機構: Nanyang Technological University

In this study, a constant amplitude charge-pumping (CP) measurement system was successfully setup. This system was used to analyse hot-carrier effects in submicrometer p-channel MOSFETs (metal-oxide-semiconductor field effect transistor) during hot-carrier stress and after termination of hot-carrier...